Schlagwort: IMW

Achieving a Dielectric Constant of 60 in ZrxHf1−xO2: A Candidate for DRAM?

2026 IEEE International Memory Workshop (IMW)
10.1109/IMW68301.2026.11532794

Novel Ultrafast Non-Destructive Readout of FeRAM by Low-Voltage Transient Current

2025 IEEE International Memory Workshop
10.1109/IMW61990.2025.11026930

Charge trapping challenges of CMOS embedded complementary FeFETs

International Memory Workshop
>10.1109/IMW59701.2024.10536957