Dopant segregation effects on ohmic contact formation in nanoscale silicon

Solid-State Electronics

Reliability characterization of non-hysteretic charge amplification in MFIM device

Solid-State Electronics

Novel experimental methodologies to reconcile large- and small-signal responses of Hafnium-based Ferroelectric Tunnel Junctions

Solid-state electronics

Three-to-one analog signal modulation with a single back-bias-controlled reconfigurable transistor

Nature Communications

Versatile experimental setup for FTJ characterization

Solid-State Electronics