Speeding-Up Emerging Device Development Cycles by Generating Models via Machine-Learning directly from Electrical Measurements

IEEE European Solid-State Electronics Research Conference
>10.1109/ESSERC62670.2024.10719591

Small-Signal Characterization and Modelling of a Back Bias Reconfigurable Field Effect Transistor

 IEEE European Solid-State Electronics Research Conference
>10.1109/ESSERC62670.2024.10719561

Understanding the impact of the dielectric layer in modulating the TER of FTJ devices

 IEEE European Solid-State Electronics Research Conference
>10.1109/ESSERC62670.2024.10719445