Schlagwort: ICMTS

Comparative Study of Switching Dynamics in Ferroelectric-based Capacitors with Different Design Options

IEEE 37th International Conference on Microelectronic Test Structures (ICMTS)
10.1109/ICMTS63811.2025.11068911

Understanding the Substrate Effect on De-embedding Structures Fabricated on SOI Wafers Using Electromagnetic Simulation

International Conference on Microelectronic Test Structures
>10.1109/ICMTS59902.2024.10520694

Analysis and Compensation of the Series Resistance Effects on the Characteristics of Ferroelectric Capacitors

International Conference on Microelectronic Test Structures
>10.1109/ICMTS59902.2024.10520684