The 68th Annual IEEE International Electron Devices Meeting is taking place in San Francisco, CA in the next few days (December 3-7, 2022) and NaMLab is participating with an author contribution!
In association with the 3eFerro project, join Ruben Alcala in his talk, The Role of Interface Dynamics on the Reliability Performance of BEOL Integrated Ferroelectric HfO2 Capacitors, where he presents a novel device operation interpretation that establishes the device’s interfaces as a key component for reliability performance of HfO2-based ferroelectrics for commercial memories.